APX-YMSPro
AI-Powered All-in-One Platform for Yield Data Management & Analytics
Overview
Yield Analysis for Fab & Fabless
YMSPro delivers comprehensive yield analysis by seamlessly integrating data cleansing, storage, and cross-linking into a single platform—spanning from R&D through mass production. With built-in intelligent diagnostics, it enables faster root-cause identification and actionable insights, helping teams accelerate yield learning and drive continuous improvement across the semiconductor lifecycle.
Advantages
Query & Analyze TB Data in Seconds
Our MPP-powered engine enables.
Lightning-fast retrieval and analysis on TB data.
Supporting 2000 concurrent users without compromising performance.
Wave Goodbye to Long Waits !
Intelligent Root Cause Identification
Built-in advanced ML algorithms.
Automatically correlates multiple source data.
Reduce root cause analysis time from hours to minutes – delivering >10x efficiency gains.
Empower Every Level Accelerate Rookies, Elevate Experts
Smart Built-in Dashboard: provide guidance for new hires, accelerating onboarding.
Flexible DE-G analytics tools empower senior engineers to deep dive the complex issues.
One platform for all levels.
Expert Dashboards Deliver One-Click Insights
Expert-designed, built-in dashboards deliver standardized high-quality analysis.
From high level trends to detailed drill-down diagnosis, turning days of work into minutes with key insights captured.
Chip Life Cycle Data from design/process/packaging
Complete data collection from design hotspot, process history, inline measurement, tool sensor, function test, packaging, SLT, etc.
Data are cleansed & linked for fast retrieval, analysis, alarm, ink and traceability.
Customization-friendly Platform
The system provides powerful APIs and configurable analytics components (like modular blocks).
Enabling Fab/Fabless IT to quickly build custom dashboards and diagnostic views tailored to their workflows.